Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films

abstract

PbZr1-xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena.

keywords

ZIRCONATE-TITANATE FILMS; SELF-POLARIZATION; ELECTRICAL-PROPERTIES; THICKNESS DEPENDENCE; FERROELECTRIC-FILMS; PBZR1-XTIXO3; CAPACITORS

subject category

Materials Science; Physics

authors

Lima, EC; Araujo, EB; Bdikin, IK; Kholkin, AL

our authors

acknowledgements

We would like to express our gratitude to the Brazilian agencies FAPESP (Research projects: 2013/12642-7, 2010/16504-0 and 2007/08534-3) and CNPq (Grant: 305973/2012-6) for their financial support. Center for Research on Ceramic and Composite materials (CICECO) of the University of Aveiro (PEst-C/CTM/LA0011/2013) is acknowledged for the support.

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