The self-polarization effect in Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation

abstract

This work demonstrates the existence of a self-polarization effect in Pb(Zr0.50Ti0.50)O-3 thin films with no preferential orientation. Piezoresponse Force Microscopy (PFM) and dielectric measurements were used to study the origin of this effect. The presence of only one peak shifting slightly to the negative side in the piezoresponse histogram indicates the existence of a self-polarization effect in the studied films. An increase in self-polarization was observed when the film thickness increases from 200 nm to 710 nm. The results suggest that Schottky barriers and/or mechanical coupling near the film-electrode interface are not the main mechanisms responsible for the self-polarization effect in the studied films. (c) 2012 Elsevier Ltd. All rights reserved.

keywords

PIEZOELECTRIC PROPERTIES; FORCE MICROSCOPY

subject category

Materials Science

authors

Lima, EC; Araujo, EB; Bdikin, IK; Kholkin, AL

our authors

acknowledgements

We would like to express our gratitude to the Brazilian Agencies FAPESP (Process Nos. 2007/08534-3 and 2010/16504-0), CNPq (Research Grant No. 307607/2009-7) and CAPES (Process No. 23038.028109 2009-26) for their financial support.

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