Imprinting of anisotropic stress during C-60 high-pressure/high-temperature polymerization process

abstract

Synchrotron x-ray two-dimensional diffraction was used to study the evolution of C-60 polymerization in samples quenched from high pressure-high temperature. As for three-dimensional polymers, Debye-Scherrer ellipses are observed at low-pressure conditions, they are disrupted as polymerization progresses indicating an alignment of the growing polymer that finishes in fully textured samples. The anisotropic stress signature on C-60 polymers gives a direct visualization of the permanent imprinting of a mechanical applied field. The anisotropic stress component is an essential factor for C-60 directed polymerization.

keywords

SOLID C60; PHASE; FULLERENE; DETECTOR; CRYSTAL

subject category

Physics

authors

Marques, L; Mezouar, M; Hodeau, JL; Nunez-Regueiro, M

our authors

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