Deposition parameters and annealing key role in setting structural and polar properties of Bi0.9La0.1Fe0.9Mn0.1O3 thin films

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abstract

The present work explores the processing conditions of Bi0.9La0.1Fe0.9Mn0.1O3 (BLFM) thin films, grown by RF sputtering on platinum metalized silicon substrates, and its impact on the structural and ferroelectric properties. The optimized processing conditions were found to be a combination of deposition of an amorphous film at low substrate temperature (ae550 A degrees C), followed by a thermal treatment at 550 A degrees C during 30 min, in order to prevent bismuth volatilization. This procedure leads to the formation of high-quality monophasic crystalline films with well-defined piezoelectric response exhibiting micron size domains.

keywords

BISMUTH FERRITE; BIFEO3; LA; TEMPERATURE; SUBSTRATE; CERAMICS

subject category

Engineering; Materials Science; Physics

authors

Carvalho, TT; Figueiras, FG; Pereira, SMS; Fernandes, JRA; de la Cruz, JP; Tavares, PB; Almeida, A; Moreira, JA

our authors

foto Fábio Gabriel Nazário Figueiras

Fábio Gabriel Nazário Figueiras

Post-Doc Fellowship
foto Sérgio Manuel de Sousa Pereira

Sérgio Manuel de Sousa Pereira

Principal Researcher

Groups

1 - Inorganic Functional Nanomaterials and Organic-Inorganic Hybrids

Projects

Material´s Characterization with Nuclear Radioactive Techniques - synergy and complementarity applied to training and development (old project: Perturbed Angular Correlations and Electron Channeling Experiments at ISOLDE-CERN) (CERN/FIS-NUC/0004/2015)
CICECO - Aveiro Institute of Materials (UID/CTM/50011/2013)

acknowledgements

This work was developed in the scope of the project FCT/CERN/FIS-NUC/0004/2015, Norte-070124-FEDER-000070, I3N (PEst-C/CTM/LA0025/2013-14), CICECO-Aveiro Institute of Materials (UID/CTM/50011/2013), and PTDC/FIS-NAN/0533/2012, Grant SFRH/BD/41331/2007; SFRH/BPD/80663/2011 financed by national funds through the FCT/MEC, and when applicable co-financed by FEDER under the PT2020 Partnership Agreement.

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Publication Details

type
Journal Article
year
2017
journal
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
volume
28
publisher
SPRINGER
issn
0957-4522
isbn
1573-482X
issue
17
digital object identifier
10.1007/s10854-017-7094-0
web of science article identifier
WOS:000407946700038

Journal Metrics (JCR 2019)

Journal Impact Factor
2.22
Journal Impact Factor (5 yrs)
2.078
category normalized journal percentile
48.512

Citations

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